Photonic Lattice, Inc. Stress Birefringence System for measuring the magnitude, direction, and distribution of stress in transparent materials. It is widely used in stress birefringence measurement of glass, optical film, injection lens, optical devices, wafers, infrared materials and so on.
Based on the dual confocal optical system, Japan Lasertec is equipped with differential interference observation, vertical white light interference measurement, phase difference interference measurement, reflective spectroscopic film thickness measurement and other functions. Generally, the test can be completed by more than one device.
A high-speed ellipsometer developed by Photonic Lattice, Inc. of Japan based on the self-developed photonic crystal technology can quickly and accurately measure the entire film thickness data. The film thickness distribution of the 6-inch wafer can be obtained in 3 minutes, and the film thickness on the micro-area and transparent substrate can also be measured.