New product release - silicon carbide wafer stress birefringence measurement system

Release time:2023-02-09 17:49:11
Publisher:OE
Views:

Photonic Lattice, Inc.公司针对晶圆厂对晶圆缺陷检测的需求,推出了晶圆双折射测量装置,让客户高效的得到晶圆的双折射信息,目前在SIC、蓝宝石、GaN、金刚石等应用成熟。

  


蓝宝石面板的应力双折射测量实例


1q9g.png


 














Sic晶圆的测量实例


SIC.png













Beijing Optic Electronic Tech Ltd

TEL:010-69798892

FAX:010-69798893

TOM:13910937780(WeChat)

BOB:17600738803(WeChat) 

Email:sales@oelectron.com
add:3rd floor, Huilongguan Longguan Building, Changping District, Beijing

Official account

Beijing Optic Electronic Tech Ltd copyright © 2022 All Rights Reserved. 京ICP备15048507号

  • Home
  • Tel
  • Mess
  • Top
  • You can fill in the following information and leave a message to us, and we will reply to you as soon as possible.
    Company*
    Product*
    Name*
    Phone*
    * is required