Stress birefringence measuring system
Stress birefringence system NIR series

PA-300-NIR uses 850 nm in the near-infrared band for the measurement of wave length, the distribution of birefringence/phase difference can be measured at high speed with 5 Megapixels resolution even for materials that are opaque to the naked eye. This equipment is targeted for low phases with a measurement range of 0 to 213 nm.
Suitable for measuring targets that make near-infrared wave lengths transparent like chalcogenide lenses.

产品说明

Suitable for measuring targets that make near-infrared wave lengths transparent like chalcogenide lenses.

WPA-200-NIR uses three wavelengths in the near-infrared band for the measurement wavelengths, and the birefringence of the measurement target transmitting near-infrared wavelengths can be measured.
Suitable for measuring targets that make near-infrared wave lengths transparent like LiDAR automotive components, etc.

主要特点

可快速自动测量红外产品应力双折射的大小、方向和分布

面测量、可一次测量视野范围内样品的全部数据

具备点、线、面、3D的分析功能

可输出光程差(nm)、偏振角度(°)、应力(Mpa)、应力双折射(nm/mm)


技术参数

NIR参数.PNG

实测案例

NIR实测案例.PNG

Beijing Optic Electronic Tech Ltd

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