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New product release - silicon carbide wafer stress birefringence measurement system

Release time：2023-02-09 17:49:11
Publisher：OE
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Photonic Lattice, Inc.公司针对晶圆厂对晶圆缺陷检测的需求，推出了晶圆双折射测量装置，让客户高效的得到晶圆的双折射信息，目前在SIC、蓝宝石、GaN、金刚石等应用成熟。

  


蓝宝石面板的应力双折射测量实例


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Sic晶圆的测量实例


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